{"created":"2023-05-15T14:46:09.734444+00:00","id":63056,"links":{},"metadata":{"_buckets":{"deposit":"ae29656c-a78d-4fbf-abb9-edc32aeaef88"},"_deposit":{"created_by":1,"id":"63056","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"63056"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00063056","sets":["10:29"]},"author_link":["622898","622909","622900","622904","622905","622899","622902","622906","622907","622903","622908","622901"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2009-03-28","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"CR-39固体飛跡検出器などに生成したエッチピットの計測方法としては、エッチピット開口部の顕微鏡画像からピットの長短径を抽出しするのが一般的である。しかしながら、飛跡生成感度（S）が十分に大きくなってくると（S~5）、ピット径とSとの間に成り立つ幾何学に従って、Sの微小増加量に対するピット径の差が殆どなくなってしまう（飽和してしまう）ために、十分な電荷分解能で電荷弁別できない。一方、最も直接的な情報であるエッチピットの深さ（コーン長）は、単純に飛跡生成感度の比例関係になるので、原理的にはSの増加に伴うエッチピット深さの飽和は起こらない。従来、エッチピットの深さ測定は目視による作業によるもので、非常に手間と時間が掛かっていた。本研究では、エッチピットの深さ方向への断層画像を撮像し、画像処理によってエッチピット深さを自動測定する顕微鏡系の検討を行っているので、その開発現状について報告する。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第24回固体飛跡検出器研究会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"小平, 聡"}],"nameIdentifiers":[{"nameIdentifier":"622898","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"安田, 仲宏"}],"nameIdentifiers":[{"nameIdentifier":"622899","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"本間, 義浩"}],"nameIdentifiers":[{"nameIdentifier":"622900","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"梅島, 洋介"}],"nameIdentifiers":[{"nameIdentifier":"622901","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"阿須賀, 拓"}],"nameIdentifiers":[{"nameIdentifier":"622902","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"太田, 周也"}],"nameIdentifiers":[{"nameIdentifier":"622903","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐藤, 匡"}],"nameIdentifiers":[{"nameIdentifier":"622904","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平 聡","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"622905","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"安田 仲宏","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"622906","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"阿須賀 拓","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"622907","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"太田 周也","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"622908","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐藤 匡","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"622909","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"エッチピット深さ測定用顕微鏡系の検討","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"エッチピット深さ測定用顕微鏡系の検討"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-04-17"},"publish_date":"2009-04-17","publish_status":"0","recid":"63056","relation_version_is_last":true,"title":["エッチピット深さ測定用顕微鏡系の検討"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T21:23:42.220166+00:00"}