{"created":"2023-05-15T14:46:07.510100+00:00","id":63006,"links":{},"metadata":{"_buckets":{"deposit":"cea76d1d-9844-4125-b1b7-9cccd6386570"},"_deposit":{"created_by":1,"id":"63006","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"63006"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00063006","sets":["10:29"]},"author_link":["622297","622305","622302","622295","622300","622293","622304","622301","622307","622303","622298","622294","622292","622299","622296","622306"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2009-03-17","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"イオンビームを用いた元素分析法の一つであるPIXE分析法は、多元素を同時に分析することができることから、定性面の分析において数多く研究に用いられているが、近年では検出感度の向上と定量化が強く望まれるようになった。そのため我々は、二次元元素マップの取得が可能なマイクロビームスキャニングPIXE分析ラインにおいても定量化のための技術開発を進めることにした。定量化において、試料に対するイオンビーム照射量の正確な測定が必須であることから、ビームをスキャンした状態でも測定可能な、二次電子を利用した電流モニタの開発に着手した。現在、予備実験中であるが、その途中経過を報告する。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"第４回技術と安全の報告会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"石川, 剛弘"}],"nameIdentifiers":[{"nameIdentifier":"622292","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"磯, 浩之"}],"nameIdentifiers":[{"nameIdentifier":"622293","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"及川, 将一"}],"nameIdentifiers":[{"nameIdentifier":"622294","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小西, 輝昭"}],"nameIdentifiers":[{"nameIdentifier":"622295","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村, 尚"}],"nameIdentifiers":[{"nameIdentifier":"622296","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"樋口, 有一"}],"nameIdentifiers":[{"nameIdentifier":"622297","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"酢屋, 徳啓"}],"nameIdentifiers":[{"nameIdentifier":"622298","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"濱野, 毅"}],"nameIdentifiers":[{"nameIdentifier":"622299","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今関, 等"}],"nameIdentifiers":[{"nameIdentifier":"622300","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"石川 剛弘","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"622301","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"及川 将一","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"622302","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小西 輝昭","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"622303","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村 尚","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"622304","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"酢屋 徳啓","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"622305","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"濱野 毅","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"622306","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今関 等","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"622307","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"Micro scanning PIXEにおける照射量測定システムの開発 その1","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Micro scanning PIXEにおける照射量測定システムの開発 その1"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-03-25"},"publish_date":"2009-03-25","publish_status":"0","recid":"63006","relation_version_is_last":true,"title":["Micro scanning PIXEにおける照射量測定システムの開発 その1"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T21:24:16.485488+00:00"}