{"created":"2023-05-15T14:43:25.451071+00:00","id":59480,"links":{},"metadata":{"_buckets":{"deposit":"bd16d227-a008-40d8-8108-96800e1b5b05"},"_deposit":{"created_by":1,"id":"59480","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"59480"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00059480","sets":["10:29"]},"author_link":["592041","592042","592038","592039","592045","592043","592040","592044"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2002-11-25","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"In March 1999, we installed an accelerator in the Electrostatic Accelerator Building for PIXE (Particle Induced X-ray Emission) analysis. The accelerator facility incorporates three beam lines for conventional, in-air and scanning microbeam PIXE analysis. The scanning microbeam PIXE analysis system provides the ability of multi-elemental mapping over sample areas up to 2 x 2mm area with spatial resolutions routinely at 1 micro meter. The scheduled operation of this facility started in April 2000. The result of beam resolution tests carried out in 2001 are as follows: For Scanning Transmission Ion Microscopy (STIM), the estimated beam size is 100 x 200 nm. For PIXE operation at 50 pA of beam current, the estimated best spot size is 0.4 x 0.6 micro meters. The micro-beam apparatus is being used for research into the elemental distribution of small biological samples such as biological cells and tissue.","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"２１世紀連合シンポジウム-科学技術と人間","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"今関, 等"}],"nameIdentifiers":[{"nameIdentifier":"592038","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"湯川, 雅枝"}],"nameIdentifiers":[{"nameIdentifier":"592039","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"石川, 剛弘"}],"nameIdentifiers":[{"nameIdentifier":"592040","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"濱野, 毅"}],"nameIdentifiers":[{"nameIdentifier":"592041","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今関 等","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"592042","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"湯川 雅枝","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"592043","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"石川 剛弘","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"592044","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"濱野 毅","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"592045","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"PIXE（荷電粒子励起エックス線）分析用加速器システム","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"PIXE（荷電粒子励起エックス線）分析用加速器システム"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2002-12-16"},"publish_date":"2002-12-16","publish_status":"0","recid":"59480","relation_version_is_last":true,"title":["PIXE（荷電粒子励起エックス線）分析用加速器システム"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T22:04:27.592217+00:00"}