{"created":"2023-05-15T14:43:21.654723+00:00","id":59395,"links":{},"metadata":{"_buckets":{"deposit":"1def22e8-aa0a-476d-9e39-6bd164bbf64a"},"_deposit":{"created_by":1,"id":"59395","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"59395"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00059395","sets":["10:29"]},"author_link":["591163","591170","591164","591171","591165","591166","591172","591168","591162","591167","591169"],"item_10005_date_7":{"attribute_name":"発表年月日","attribute_value_mlt":[{"subitem_date_issued_datetime":"2002-09-20","subitem_date_issued_type":"Issued"}]},"item_10005_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"我々は、リンK殻共鳴内殻電離を生じるエネルギーのＸ線では通常のＸ線に比べて致死効果が高いこと、およびほ乳類細胞に生じる染色体切断が、細胞内で修復されにくいことを示すデータを得た。内殻電離による主な細胞内損傷はDNA２重鎖切断である可能性が高い。そこでこのリンK殻内殻電離により生じる主な細胞内損傷がDNA２重鎖切断であるかどうか、またそのDNA２重鎖切断が修復可能であるかどうかを明らかにするため、DNA２重鎖切断修復欠損細胞を用いた解析を行った。　KEK物構研・放射光BL-27AポートにおいてリンK殻共鳴エネルギー（2.153 keV）およびその両側のエネルギー（2.146、2.160 keV）を８種類のほ乳類培養細胞に照射し、コロニー形成法により生残率を測定した。いずれの細胞も、リンK殻共鳴エネルギー（2.153 keV）を照射した場合がもっとも感受性が高く、次いで高エネルギー側（2.160 keV）、低エネルギー側（2.146 keV）の順に抵抗性となった。2.146 keV Ｘ線を基準とした場合の生物学的効果比は、野生株(V79, FM3A, L5178Y) および相同組換え修復系を欠損する irs1細胞(XRCC2), irs1SF細胞（XRCC3）で約1.6、非相同結合修復系を欠損するSX9細胞（XRCC7, DNA-PKcs欠損）、SX10細胞（DNA ligase IV欠損）およびM10細胞(XRCC4)で1.4から1.5であり、大きな差は認められなかった。","subitem_description_type":"Abstract"}]},"item_10005_description_6":{"attribute_name":"会議概要（会議名, 開催地, 会期, 主催者等）","attribute_value_mlt":[{"subitem_description":"日本放射線影響学会第４５回大会","subitem_description_type":"Other"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"笠井, 清美"}],"nameIdentifiers":[{"nameIdentifier":"591162","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"前澤, 博"}],"nameIdentifiers":[{"nameIdentifier":"591163","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小林, 克己"}],"nameIdentifiers":[{"nameIdentifier":"591164","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宇佐美, 徳子"}],"nameIdentifiers":[{"nameIdentifier":"591165","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"大内, 弘美"}],"nameIdentifiers":[{"nameIdentifier":"591166","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐藤, 弘毅"}],"nameIdentifiers":[{"nameIdentifier":"591167","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"笠井 清美","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"591168","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"前澤 博","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"591169","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小林 克己","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"591170","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宇佐美 徳子","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"591171","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"大内 弘美","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"591172","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference object","resourceuri":"http://purl.org/coar/resource_type/c_c94f"}]},"item_title":"DNA修復欠損突然変異細胞株を用いたリンｋ核内殻電離によるDNA損傷の解析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"DNA修復欠損突然変異細胞株を用いたリンｋ核内殻電離によるDNA損傷の解析"}]},"item_type_id":"10005","owner":"1","path":["29"],"pubdate":{"attribute_name":"公開日","attribute_value":"2002-09-25"},"publish_date":"2002-09-25","publish_status":"0","recid":"59395","relation_version_is_last":true,"title":["DNA修復欠損突然変異細胞株を用いたリンｋ核内殻電離によるDNA損傷の解析"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T22:05:24.882061+00:00"}