{"created":"2023-05-15T14:42:48.984448+00:00","id":58667,"links":{},"metadata":{"_buckets":{"deposit":"45a4bd04-b0b2-41de-818c-8992c388950c"},"_deposit":{"created_by":1,"id":"58667","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"58667"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00058667","sets":["11"]},"author_link":["585815","585814"],"item_10004_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-12","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"12","bibliographicPageEnd":"28","bibliographicPageStart":"23","bibliographicVolumeNumber":"86","bibliographic_titles":[{"bibliographic_title":"金属"}]}]},"item_10004_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"高輝度放射光の利用によって実験室X線では困難なX線分析が可能となる。特に、様々な環境下で材料の成長や合成、機能発現の状態を観察する「その場測定手法」が大きく進歩している。量子科学技術研究開発機構の専用ビームラインで開発されている高温高圧合成のその場観察、半導体結晶成長の観察、共鳴非弾性X線散乱、放射光メスバウアー分光の4つの手法を紹介する。","subitem_description_type":"Abstract"}]},"item_10004_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"アグネ技術センター"}]},"item_10004_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0368-6337","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"片山, 芳則"}],"nameIdentifiers":[{"nameIdentifier":"585814","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"片山 芳則","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"585815","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"高輝度放射光が可能にするその場測定手法","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"高輝度放射光が可能にするその場測定手法"}]},"item_type_id":"10004","owner":"1","path":["11"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-01-11"},"publish_date":"2017-01-11","publish_status":"0","recid":"58667","relation_version_is_last":true,"title":["高輝度放射光が可能にするその場測定手法"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T22:13:32.692357+00:00"}