{"created":"2023-05-15T14:40:47.730811+00:00","id":55950,"links":{},"metadata":{"_buckets":{"deposit":"7b6ac024-e75b-479b-a832-677bf5032726"},"_deposit":{"created_by":1,"id":"55950","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"55950"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00055950","sets":["7"]},"author_link":["572551","572552","572553","572554","572548","572550","572549","572547"],"item_10004_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2015-03","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"61","bibliographicPageStart":"57","bibliographic_titles":[{"bibliographic_title":"平成25年度サイクロトロン利用報告書"}]}]},"item_10004_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"サイクロトロン棟汎用照射室のC-8コースにおいて、広く平坦な陽子線の検出器校正用の照射場を構築している。これまでに、標準的なビームとして70 MeV陽子線を中心に照射場の構築を行ってきた。照射場の平坦さの確認をリアルタイムで行い、ビームサイズのカスタマイズを可能にするために多チャンネル型電離箱(MCIC)を導入した。MCICの校正手法を確立し、平坦な照射場を作成しビームプロファイルの測定を行なった。","subitem_description_type":"Abstract"}]},"item_10004_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://web.nirs.go.jp/HomePage/Jyuryushi/cyc/index.htm"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://web.nirs.go.jp/HomePage/Jyuryushi/cyc/index.htm","subitem_relation_type_select":"URI"}}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"北村, 尚"}],"nameIdentifiers":[{"nameIdentifier":"572547","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平, 聡"}],"nameIdentifiers":[{"nameIdentifier":"572548","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小林, 進悟"}],"nameIdentifiers":[{"nameIdentifier":"572549","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"内堀, 幸夫"}],"nameIdentifiers":[{"nameIdentifier":"572550","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村 尚","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"572551","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平 聡","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"572552","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小林 進悟","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"572553","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"内堀 幸夫","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"572554","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"検出器校正用の照射場の作成","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"検出器校正用の照射場の作成"}]},"item_type_id":"10004","owner":"1","path":["7"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-25"},"publish_date":"2015-03-25","publish_status":"0","recid":"55950","relation_version_is_last":true,"title":["検出器校正用の照射場の作成"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T22:43:31.342522+00:00"}