@article{oai:repo.qst.go.jp:00055414,
 author = {Ide, Hiroshi and Teratou, Hiroaki and Furusawa, Yoshiya and 井出 博 and 寺東 宏明 and 古澤 佳也},
 journal = {Annual Report of the Research Project with Heavy Ions at NIRS-HIMAC},
 month = {May},
 note = {Bistranded clustered DNA damage induced by ionizing radiation is assumed to be resistant to repair and cause error prone repair, hence resulting in cell killing and mutations. In this study, we have analyzed isolated and bistranded clustered DNA damages generated by high-energy C (290 MeV/amu, 13 keV/um) and Fe ion beams (500 MeV/amu, 200 keV/um). For pDEL19 DNA, SSB and DSB were quantified by agarose gel electrophoresis. Isolated and bistranded clustered base lesions were analyzed by the treatment with DNA glycosylases. For lambda DNA, isolated and clustered damages were analyzed by the aldehyde reactive probe (ARP) assay and pulse field gel electrophoresis, respectively. With both types of DNA, the yield of individual isolated damages (SSB and base lesions) decreased with increasing LET. The yield of DSB and clustered base lesions also decreased to various extents. The total yield of clustered damage (DSB + clustered base lesions) pertinent to cell killing and mutations decreased with increasing LET. These results suggest a crucial role of more complex damage clusters that cannot be distinguished by the simple analysis of direct and DNA glycosylase-induced DSB.},
 pages = {116--117},
 title = {Analysis of Clustered DNA Damage Produced by Heavy Ion Beams},
 volume = {2005},
 year = {2005}
}