{"created":"2023-05-15T14:40:01.465425+00:00","id":54925,"links":{},"metadata":{"_buckets":{"deposit":"f09a9da8-f23a-48fe-886e-60a7df9d8da9"},"_deposit":{"created_by":1,"id":"54925","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"54925"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00054925","sets":["2"]},"author_link":["561645","561642","561643","561644","561646","561647"],"item_10003_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-10","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"568","bibliographicPageStart":"566","bibliographic_titles":[{"bibliographic_title":"Proceedings of the 15th Annual Meeting of Particle Accelerator Society of Japan"}]}]},"item_10003_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"高崎研AVFサイクロトロンではイオン源で生成したビームを最大限加速するため、入射ビームのエミッタンス形状を制御してサイクロトロンのアクセプタンス形状に整合させるビーム入射調整方法を開発している。このエミッタンス形状制御には入射ビームの四次元エミッタンスデータを基にビーム輸送計算を用いて構成機器のパラメータを導出することが必要である。今回、この4次元エミッタンスデータを得るため、二次元エミッタンス評価用に用いられているスリット-ハープ装置の水平(x)・鉛直(y)方向測定機器を組み合わせる方法を考案した。具体的には、エミッタンス測定用のxスリットとyスリットを用いたxハープによるx'分布測定とyハープによるy'分布測定をそれぞれ行ってビームの(x,y,x')分布と(x,y,y')分布を測定し、その結果から位置(x,y)のビーム発散角(x',y')を求める方法である。測定・解析プログラムを作成し、実験を行った結果、本方法により4次元エミッタンスデータが得られることを確認した。","subitem_description_type":"Abstract"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"柏木, 啓次"}],"nameIdentifiers":[{"nameIdentifier":"561642","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮脇, 信正"}],"nameIdentifiers":[{"nameIdentifier":"561643","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"倉島, 俊"}],"nameIdentifiers":[{"nameIdentifier":"561644","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"柏木 啓次","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"561645","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮脇 信正","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"561646","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"倉島 俊","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"561647","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Preliminary results of four-dimensional emittance estimation using slit-harp device","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Preliminary results of four-dimensional emittance estimation using slit-harp device"}]},"item_type_id":"10003","owner":"1","path":["2"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-10-09"},"publish_date":"2018-10-09","publish_status":"0","recid":"54925","relation_version_is_last":true,"title":["Preliminary results of four-dimensional emittance estimation using slit-harp device"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T22:55:17.549049+00:00"}