{"created":"2023-05-15T14:39:50.401475+00:00","id":54675,"links":{},"metadata":{"_buckets":{"deposit":"4198c687-505d-415a-8950-c54a25430ce2"},"_deposit":{"created_by":1,"id":"54675","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"54675"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00054675","sets":["2"]},"author_link":["558780","558782","558779","558781","558783","558778"],"item_10003_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-12","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"621","bibliographicPageStart":"619","bibliographicVolumeNumber":"13","bibliographic_titles":[{"bibliographic_title":"Proceedings of the 13th Annual Meeting of Particle Accelerator Society of Japan"}]}]},"item_10003_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"量研機構高崎研TIARAでは、サイクロトロンへの入射ビームの位置と角度を制限する2つの可動スリットで位相平面領域を制限することにより、入射ビームのエミッタンスとサイクロトロンのアクセプタンスを測定する装置を開発した。この装置を用いたエミッタンス測定は水平、鉛直の各位相平面につき7分程度もの時間を要し、繰り返し測定が必要なイオン源の調整等を効率的に行うためには測定時間の短縮が必要であった。そこで、2つの可動スリットの内の後段スリット（角度制限用）に替わる48本のワイヤー（ハープ）を設置し、ビームの角度広がりを同時に検出することで測定時間の短縮化を図った。その結果、従来に比べ約1/8の1分以内で測定が完了することを確認した。","subitem_description_type":"Abstract"}]},"item_10003_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://www.pasj.jp/web_publish/pasj2016/proceedings/PDF/MOP0/MOP088.pdf"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.pasj.jp/web_publish/pasj2016/proceedings/PDF/MOP0/MOP088.pdf","subitem_relation_type_select":"URI"}}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"柏木, 啓次"}],"nameIdentifiers":[{"nameIdentifier":"558778","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮脇, 信正"}],"nameIdentifiers":[{"nameIdentifier":"558779","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"倉島, 俊"}],"nameIdentifiers":[{"nameIdentifier":"558780","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"柏木 啓次","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"558781","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮脇 信正","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"558782","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"倉島 俊","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"558783","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Development of a fast emittance measurement system with the slit-harp method","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Development of a fast emittance measurement system with the slit-harp method"}]},"item_type_id":"10003","owner":"1","path":["2"],"pubdate":{"attribute_name":"公開日","attribute_value":"2016-12-02"},"publish_date":"2016-12-02","publish_status":"0","recid":"54675","relation_version_is_last":true,"title":["Development of a fast emittance measurement system with the slit-harp method"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T22:58:06.932233+00:00"}