{"created":"2023-05-15T14:39:44.533357+00:00","id":54579,"links":{},"metadata":{"_buckets":{"deposit":"2bf6b999-3c41-4164-bdb8-86c3785716f4"},"_deposit":{"created_by":1,"id":"54579","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"54579"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00054579","sets":["2"]},"author_link":["557563","557557","557560","557562","557565","557556","557564","557558","557561","557559"],"item_10003_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2015-04","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicPageEnd":"193","bibliographicPageStart":"193","bibliographicVolumeNumber":"35","bibliographic_titles":[{"bibliographic_title":"医学物理"}]}]},"item_10003_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"製品評価技術基盤機構が発行するJCT-21007技術的要求事項適用指針（適用指針）標準電位計で決定した電荷は、校正のための絶対値となり得る。しかし適用指針はユーザ電位計を比較校正する際の測定対象となる電荷（測定電荷）にまで言及していない。\n測定電荷の組み立て方法は、A）直流電流×時間（Q=I×ｔ）及びB）静電容量×直流電圧（Q=C×V）の2通りが考案できる。方法は多種の電位計、大電荷の組み立てに対応でき、二次校正機関での量産的な校正に適しているが方法Bより不安定と考えられる。そこで測定電荷をA及びBの方法で組み立て、比較した。","subitem_description_type":"Abstract"}]},"item_10003_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"日本医学物理学会"}]},"item_10003_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1345-5362","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"高瀬, 信宏"}],"nameIdentifiers":[{"nameIdentifier":"557556","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐方, 周防"}],"nameIdentifiers":[{"nameIdentifier":"557557","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"成田, 克久"}],"nameIdentifiers":[{"nameIdentifier":"557558","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"水野, 秀之"}],"nameIdentifiers":[{"nameIdentifier":"557559","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"福村, 明史"}],"nameIdentifiers":[{"nameIdentifier":"557560","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"al., et"}],"nameIdentifiers":[{"nameIdentifier":"557561","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"高瀬 信宏","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"557562","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"佐方 周防","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"557563","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"水野 秀之","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"557564","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"福村 明史","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"557565","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Development of a separated calibration system for electrometer and ionizing chamber (2): Charge for comparative calibration","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Development of a separated calibration system for electrometer and ionizing chamber (2): Charge for comparative calibration"}]},"item_type_id":"10003","owner":"1","path":["2"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-08-17"},"publish_date":"2015-08-17","publish_status":"0","recid":"54579","relation_version_is_last":true,"title":["Development of a separated calibration system for electrometer and ionizing chamber (2): Charge for comparative calibration"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T22:59:14.021686+00:00"}