{"created":"2023-05-15T14:39:25.564131+00:00","id":54151,"links":{},"metadata":{"_buckets":{"deposit":"3d61bcf7-140d-4cf5-945f-4ab36be7d9c4"},"_deposit":{"created_by":1,"id":"54151","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"54151"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00054151","sets":["2"]},"author_link":["552886","552891","552890","552894","552889","552896","552895","552897","552884","552899","552893","552898","552887","552885","552892","552888"],"item_10003_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2009-07","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"NIRS-M-223","bibliographicPageEnd":"15","bibliographicPageStart":"13","bibliographicVolumeNumber":"第4回　;　第2回","bibliographic_titles":[{"bibliographic_title":"技術と安全の報告会 ; 共用施設(PASTA&SPICE)共同研究成果報告会 : 報告集"}]}]},"item_10003_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"イオンビームを用いた元素分析法の一つであるPIXE分析法は、多元素を同時に分析することができることから、定性面の分析において数多く研究に用いられているが、近年では検出感度の向上と定量化が強く望まれるようになった。そのため我々は、二次元元素マップの取得が可能なマイクロビームスキャニングPIXE分析ラインにおいても定量化のための技術開発を進めることにした。定量化において、試料に対するイオンビーム照射量の正確な測定が必須であることから、電流モニタの開発から着手した。現在、予備実験中であるが、その途中経過を報告する。","subitem_description_type":"Abstract"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"石川, 剛弘"}],"nameIdentifiers":[{"nameIdentifier":"552884","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"磯, 浩之"}],"nameIdentifiers":[{"nameIdentifier":"552885","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"及川, 将一"}],"nameIdentifiers":[{"nameIdentifier":"552886","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小西, 輝昭"}],"nameIdentifiers":[{"nameIdentifier":"552887","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村, 尚"}],"nameIdentifiers":[{"nameIdentifier":"552888","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"樋口, 有一"}],"nameIdentifiers":[{"nameIdentifier":"552889","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"酢屋, 徳啓"}],"nameIdentifiers":[{"nameIdentifier":"552890","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"濱野, 毅"}],"nameIdentifiers":[{"nameIdentifier":"552891","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今関, 等"}],"nameIdentifiers":[{"nameIdentifier":"552892","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"石川 剛弘","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"552893","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"及川 将一","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"552894","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小西 輝昭","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"552895","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"北村 尚","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"552896","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"酢屋 徳啓","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"552897","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"濱野 毅","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"552898","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今関 等","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"552899","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"Micro scanning PIXEにおける照射量測定システムの開発 その1","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Micro scanning PIXEにおける照射量測定システムの開発 その1"}]},"item_type_id":"10003","owner":"1","path":["2"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-07-23"},"publish_date":"2009-07-23","publish_status":"0","recid":"54151","relation_version_is_last":true,"title":["Micro scanning PIXEにおける照射量測定システムの開発 その1"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T23:04:18.224690+00:00"}