{"created":"2023-05-15T14:38:35.652733+00:00","id":53091,"links":{},"metadata":{"_buckets":{"deposit":"a0804a11-86fa-42bb-a1b9-3739c6bdcd77"},"_deposit":{"created_by":1,"id":"53091","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"53091"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00053091","sets":["2"]},"author_link":["541519","541528","541522","541525","541520","541530","541529","541523","541521","541531","541526","541527","541524"],"item_10003_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2003-04","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"341","bibliographicPageStart":"338","bibliographicVolumeNumber":"2002","bibliographic_titles":[{"bibliographic_title":"放射線医学総合研究所重粒子線がん治療装置等共同利用研究報告書"}]}]},"item_10003_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We have been measured the recoil particles due to the proton irradiation in target material. CR-39 detectors were exposed in water column. CR-39 has no sensitivity for the incident proton (160 MeV), so that we can detect only the product of proton reaction in water and CR-39 itself. We have obtained the LET distribution at several depths in water. But it has the strong dependence of etching condition of CR-39. We will continue this work with AFM in order to reduce the ambiguity that caused by traditional optical microscopy.","subitem_description_type":"Abstract"}]},"item_10003_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"放医研"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"山本, 幹男"}],"nameIdentifiers":[{"nameIdentifier":"541519","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"安田, 仲宏"}],"nameIdentifiers":[{"nameIdentifier":"541520","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"蔵野, 美恵子"}],"nameIdentifiers":[{"nameIdentifier":"541521","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"松藤, 成弘"}],"nameIdentifiers":[{"nameIdentifier":"541522","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮原, 信幸"}],"nameIdentifiers":[{"nameIdentifier":"541523","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"西尾, 禎治"}],"nameIdentifiers":[{"nameIdentifier":"541524","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小倉, 紘一"}],"nameIdentifiers":[{"nameIdentifier":"541525","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"山本 幹男","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"541526","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"安田 仲宏","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"541527","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"蔵野 美恵子","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"541528","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"松藤 成弘","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"541529","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮原 信幸","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"541530","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"西尾 禎治","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"541531","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_title":"陽子線照射による短飛程フラグメントの計測","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"陽子線照射による短飛程フラグメントの計測"}]},"item_type_id":"10003","owner":"1","path":["2"],"pubdate":{"attribute_name":"公開日","attribute_value":"2003-09-09"},"publish_date":"2003-09-09","publish_status":"0","recid":"53091","relation_version_is_last":true,"title":["陽子線照射による短飛程フラグメントの計測"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T23:16:35.197376+00:00"}