@article{oai:repo.qst.go.jp:00049510,
 author = {Shibuya, Tatsunori and Takahashi, Takashi and Sakaue, Kazuyuki and タンフン, ヂン and Hara, Hiroyuki and Higashiguchi, Takeshi and 石野, 雅彦 and Koshiba, Yuya and 錦野, 将元 and Ogawa, Hiroshi and Tanaka, Masahito and Washio, Masakazu and Kobayashi, Yohei and Kuroda, Ryunosuke and タンフン ヂン and 石野 雅彦 and 錦野 将元},
 issue = {113},
 journal = {APPLIED PHYSICS LETTERS},
 month = {Oct},
 note = {A free-electron laser (FEL) is a robust tool for studying the interaction of intense X-ray with matter. In this study, we investigate the damage threshold and morphology of fused silica irradiated by extreme ultraviolet femtosecond pulses of FEL. The experimental results indicate the superiority of the FEL processing. The FEL-damage threshold of fused silica at a wavelength of 13.5 nm is 0.171 J/cm2, which is 20 times lower than that of a near infrared (NIR) femtosecond laser. The relationship between the crater depth and laser fluence reveals that the effective absorption length is αeff-1 = 58 nm. The damage threshold and the absorption length are the key values for smooth crater formation. In addition, the formation of rim structures and microcracks, which are usually are the critical issues in NIR laser processing, cannot be found in the interaction region. The hole diameter is maintained below the beam size at the exit.},
 title = {Deep-hole drilling of amorphous silica glass by extreme ultraviolet femtosecond pulses},
 year = {2018}
}