@article{oai:repo.qst.go.jp:00049438,
 author = {山田, 圭介 and 千葉, 敦也 and 平野, 貴美 and 齋藤, 勇一 and 山田 圭介 and 千葉 敦也 and 平野 貴美 and 齋藤 勇一},
 journal = {AIP Conference Proceedings},
 month = {Oct},
 note = {An electron-attachment-type negative C60 ion source was developed to intensify the incident negative ion beam current to a tandem accelerator.  In this ion source, negative ions are produced by the attachment of low-energy electrons to the sublimated C60.  An ion source with a filament and an oven was constructed, and a negative C60 ion beam current of 600 nA was extracted.},
 pages = {050020-1--050020-3},
 title = {Development of an electron-attachment-type negative fullerene ion source},
 volume = {2011},
 year = {2018}
}