{"created":"2023-05-15T14:38:18.316237+00:00","id":49430,"links":{},"metadata":{"_buckets":{"deposit":"0d18261d-7bd6-461b-8cd1-e24797402c28"},"_deposit":{"created_by":1,"id":"49430","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"49430"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00049430","sets":["1"]},"author_link":["499261","499259","499258","499262","499257","499260"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-09","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"27","bibliographicPageEnd":"7777","bibliographicPageStart":"7770","bibliographicVolumeNumber":"57","bibliographic_titles":[{"bibliographic_title":"Applied Optics"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"A flat-field grating spectrometer for tender X-ray emission spectroscopy has been developed. The grating has been coated with an aperiodic Ni/C multilayer that improves the diffraction efficiency in the range 1–3.5 keV at a constant angle of incidence. The aperiodic layer structure originates from the topmost bilayer with a larger thickness compared to other Ni/C bilayers. The performance of the spectrometer has been evaluated by measuring characteristic X-rays such as the L series emitted from a Cu(In,Ga)Se2-based thin-film solar cell specimen. It is shown that the Lα1,2 X-ray emission spectra of Cu, In, Ga, and Se can be clearly simultaneously observed in the range from 0.9 to 3.3 keV, and the linewidths are 4.9, 26.1, 4.6, and 6.1 eV, respectively, corresponding to a spectral resolution of 100–300. ","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"The Optical Society of America"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1364/AO.57.007770","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"https://www.osapublishing.org/ao/abstract.cfm?uri=ao-57-27-7770"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"https://www.osapublishing.org/ao/abstract.cfm?uri=ao-57-27-7770","subitem_relation_type_select":"URI"}}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2155-3165","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"今園, 孝志"}],"nameIdentifiers":[{"nameIdentifier":"499257","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ukita, Ryuichi"}],"nameIdentifiers":[{"nameIdentifier":"499258","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nishihara, Hiroaki"}],"nameIdentifiers":[{"nameIdentifier":"499259","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sasai, Hiroyuki"}],"nameIdentifiers":[{"nameIdentifier":"499260","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nagano, Tetsuya"}],"nameIdentifiers":[{"nameIdentifier":"499261","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"今園 孝志","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"499262","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Performance of a flat-field grating spectrometer for tender X-ray emission spectroscopy","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Performance of a flat-field grating spectrometer for tender X-ray emission spectroscopy"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-01-09"},"publish_date":"2019-01-09","publish_status":"0","recid":"49430","relation_version_is_last":true,"title":["Performance of a flat-field grating spectrometer for tender X-ray emission spectroscopy"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T23:19:48.710493+00:00"}