@article{oai:repo.qst.go.jp:00049049,
 author = {長谷川, 登 and 錦野, 将元 and 石野, 雅彦 and Onishi, N. and M., Ito A. and Minami, Y. and Baba, M. and Ya., Faenov A. and Inogamov, N. and 河内, 哲哉 and 近藤, 公伯 and Suemoto, T. and 長谷川 登 and 錦野 将元 and 石野 雅彦 and 河内 哲哉 and 近藤 公伯},
 journal = {Proceedings of the 15th International Conference on X-Ray Lasers},
 month = {Mar},
 note = {We modified a soft x-ray laser (SXRL) interferometer synchronized with a Ti:sapphire laser to observe a single-shot image of the nano-scale structure dynamics of materials induced by an optical laser pulse. The lateral resolution on the sample surface was improved to 0.7 μm by using precise imaging optics. Using this system, we succeeded in observing thin film structures above the solid (or liquid) surface in the femtosecond laser ablation process of metals (Au). The thin film worked as soft x-ray beam splitter. This result shows a thin film was smooth and dense (with a roughness of a few nanometers and near sold density). Furthermore, it gave rise to the possibility of generating novel transient soft x-ray optics.},
 pages = {273--278},
 title = {The Observation of Transient Thin Film Structures During the Femto-Second Laser Ablation Process by Using the Soft X-Ray Laser Probe},
 volume = {202},
 year = {2018}
}