{"created":"2023-05-15T14:37:59.742262+00:00","id":49013,"links":{},"metadata":{"_buckets":{"deposit":"6a8f07e4-3136-4d2b-95a9-065ca8e799bc"},"_deposit":{"created_by":1,"id":"49013","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"49013"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00049013","sets":["1"]},"author_link":["494263","494273","494266","494261","494277","494280","494270","494281","494279","494262","494268","494272","494282","494283","494276","494275","494267","494260","494264","494278","494271","494265","494269","494274"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-05","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"472","bibliographicPageStart":"467","bibliographicVolumeNumber":"65","bibliographic_titles":[{"bibliographic_title":"IEEE Transactions on Nuclear Science"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"New 10-µm-thick silicon microdosimeters utilizing\n3-D technology have been developed and investigated in this\npaper. The TCAD simulations were carried out to understand\nthe electrical properties of the microdosimeters’ design. A charge\ncollection study of the devices was performed using 5.5-MeV\nHe2+ ions which were raster scanned over the surface of the\ndetectors and the charge collection median energy maps were\nobtained and the detection yield was also evaluated. The devices\nwere tested in a 290 MeV/u carbon ion beam at the Heavy\nIon Medical Accelerator in Chiba (HIMAC) in Japan. Based\non the microdosimetric measurements, the quality factor and\ndose equivalent out of field were obtained in a mixed radiation\nfield mimicking the radiation environment for spacecraft in deep\nspace.","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IEEE"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1109/TNS.2017.2768062","subitem_relation_type_select":"DOI"}}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Ｔｒａｎ, Ｔｈｕｙ Ｌｉｎｈ"}],"nameIdentifiers":[{"nameIdentifier":"494260","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ｃｈａｒｔｉｅｒ, Ｌａｃｈｌａｎ"}],"nameIdentifiers":[{"nameIdentifier":"494261","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ｐｒｏｋｏｐｏｖｉｃｈ, Ａｎｔｈｏｎｙ"}],"nameIdentifiers":[{"nameIdentifier":"494262","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"ＢＯＬＳＴ, Ｄａｖｉｄ"}],"nameIdentifiers":[{"nameIdentifier":"494263","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Povoli, Marco"}],"nameIdentifiers":[{"nameIdentifier":"494264","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Summanwar, Anand"}],"nameIdentifiers":[{"nameIdentifier":"494265","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kok, Angela"}],"nameIdentifiers":[{"nameIdentifier":"494266","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Pogossov, Alex"}],"nameIdentifiers":[{"nameIdentifier":"494267","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ｐｅｔａｓｅｃｃａ, Ｍａｒｃｏ"}],"nameIdentifiers":[{"nameIdentifier":"494268","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Guatelli, Susanna"}],"nameIdentifiers":[{"nameIdentifier":"494269","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"I., Reinhard Mark"}],"nameIdentifiers":[{"nameIdentifier":"494270","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ｌｅｒｃｈ, Ｍｉｃｈａｅｌ"}],"nameIdentifiers":[{"nameIdentifier":"494271","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nancarrow, Mitchell"}],"nameIdentifiers":[{"nameIdentifier":"494272","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"松藤, 成弘"}],"nameIdentifiers":[{"nameIdentifier":"494273","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Michael, Jackson"}],"nameIdentifiers":[{"nameIdentifier":"494274","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ａｎａｔｏｌｙ, Ｒｏｚｅｎｆｅｌｄ"}],"nameIdentifiers":[{"nameIdentifier":"494275","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ｔｒａｎ Ｔｈｕｙ Ｌｉｎｈ","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"494276","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ｃｈａｒｔｉｅｒ Ｌａｃｈｌａｎ","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"494277","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ｐｒｏｋｏｐｏｖｉｃｈ Ａｎｔｈｏｎｙ","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"494278","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"ＢＯＬＳＴ Ｄａｖｉｄ","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"494279","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ｐｅｔａｓｅｃｃａ Ｍａｒｃｏ","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"494280","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ｌｅｒｃｈ Ｍｉｃｈａｅｌ","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"494281","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"松藤 成弘","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"494282","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Ａｎａｔｏｌｙ Ｒｏｚｅｎｆｅｌｄ","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"494283","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Thin Silicon Microdosimeter Utilizing 3-D MEMS Fabrication Technology: Charge Collection Study and Its Application in Mixed Radiation Fields","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Thin Silicon Microdosimeter Utilizing 3-D MEMS Fabrication Technology: Charge Collection Study and Its Application in Mixed Radiation Fields"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-05-15"},"publish_date":"2018-05-15","publish_status":"0","recid":"49013","relation_version_is_last":true,"title":["Thin Silicon Microdosimeter Utilizing 3-D MEMS Fabrication Technology: Charge Collection Study and Its Application in Mixed Radiation Fields"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T23:21:54.961468+00:00"}