@article{oai:repo.qst.go.jp:00047737,
 author = {Skukan, N. and Grilj, V. and Sudic, I. and Pomorski, M. and Kada, W. and Makino, Takahiro and Kambayashi, Y. and Ando, Yushi and Onoda, Shinobu and Sato, Shinichiro and Oshima, Takeshi and Kamiya, Tomihiro and Jaksic, M. and 牧野 高紘 and 安藤 裕士 and 小野田 忍 and 佐藤 真一郎 and 大島 武 and 神谷 富裕},
 issue = {4},
 journal = {Applied Physics Letters},
 month = {Jul},
 note = {Herein, we report on the enhanced sensitivity for the detection of charged particles in single crystal chemical vapour deposition (scCVD) diamond radiation detectors. The experimental results demonstrate charge multiplication in thin planar diamond membrane detectors, upon impact of 18MeV O ions, under high electric field conditions. Avalanche multiplication is widely exploited in devices such as avalanche photo diodes, but has never before been reproducibly  bserved in intrinsic CVD diamond. Because enhanced sensitivity for charged particle detection is obtained for short charge drift lengths without dark counts, this effect could be further exploited in the development of sensors based on avalanche multiplication and radiation detectors with extreme radiation hardness.},
 pages = {043502-1--043502-5},
 title = {Charge multiplication effect in thin diamond films},
 volume = {109},
 year = {2016}
}