{"created":"2023-05-15T14:37:02.187926+00:00","id":47731,"links":{},"metadata":{"_buckets":{"deposit":"dd97996c-e320-4be8-84f2-08adec474659"},"_deposit":{"created_by":1,"id":"47731","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"47731"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00047731","sets":["1"]},"author_link":["478938","478944","478945","478942","478937","478936","478940","478947","478946","478943","478939","478935","478949","478948","478941"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2016-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicPageEnd":"112402-4","bibliographicPageStart":"112402-1","bibliographicVolumeNumber":"55","bibliographic_titles":[{"bibliographic_title":"Japanese Journal of Applied Physics"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"Diffractions of γ rays by Si mosaic crystals with thicknesses of 20, 40, and 80 mm and by a 2-mm thick prefect Si crystal have been measured using a high flux 60Co source with an intensity of 2.2 TBq. The measured diffraction intensities at 1.17 and 1.33 MeV using 40-mm and 80-mm thick mosaic crystals have been enhanced by a factor of 8.6 compared with that of the perfect Si crystal. The integrated reflectivity is well described in statistical dynamical theory.","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"IOP Publishing"}]},"item_8_relation_14":{"attribute_name":"DOI","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.7567/JJAP.55.112402","subitem_relation_type_select":"DOI"}}]},"item_8_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"http://iopscience.iop.org/article/10.7567/JJAP.55.112402"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://iopscience.iop.org/article/10.7567/JJAP.55.112402","subitem_relation_type_select":"URI"}}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Matsuba, Shunya"}],"nameIdentifiers":[{"nameIdentifier":"478935","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hayakawa, Takehito"}],"nameIdentifiers":[{"nameIdentifier":"478936","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Shizuma, Toshiyuki"}],"nameIdentifiers":[{"nameIdentifier":"478937","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nishimori, Nobuyuki"}],"nameIdentifiers":[{"nameIdentifier":"478938","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Nagai, Ryoji"}],"nameIdentifiers":[{"nameIdentifier":"478939","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Sawamura, Masaru"}],"nameIdentifiers":[{"nameIdentifier":"478940","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"T., Angell Christopher"}],"nameIdentifiers":[{"nameIdentifier":"478941","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Fujiwara, Mamoru"}],"nameIdentifiers":[{"nameIdentifier":"478942","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hajima, Ryoichi"}],"nameIdentifiers":[{"nameIdentifier":"478943","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"早川 岳人","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"478944","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"静間 俊行","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"478945","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"永井 良治","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"478946","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"沢村 勝","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"478947","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"エンジェル クリストファー","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"478948","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"羽島 良一","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"478949","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Enhanced diffraction of MeV γ rays by mosaic crystals","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Enhanced diffraction of MeV γ rays by mosaic crystals"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-04-20"},"publish_date":"2017-04-20","publish_status":"0","recid":"47731","relation_version_is_last":true,"title":["Enhanced diffraction of MeV γ rays by mosaic crystals"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T23:36:09.702937+00:00"}