@article{oai:repo.qst.go.jp:00047731,
 author = {Matsuba, Shunya and Hayakawa, Takehito and Shizuma, Toshiyuki and Nishimori, Nobuyuki and Nagai, Ryoji and Sawamura, Masaru and T., Angell Christopher and Fujiwara, Mamoru and Hajima, Ryoichi and 早川 岳人 and 静間 俊行 and 永井 良治 and 沢村 勝 and エンジェル クリストファー and 羽島 良一},
 issue = {11},
 journal = {Japanese Journal of Applied Physics},
 month = {Oct},
 note = {Diffractions of γ rays by Si mosaic crystals with thicknesses of 20, 40, and 80 mm and by a 2-mm thick prefect Si crystal have been measured using a high flux 60Co source with an intensity of 2.2 TBq. The measured diffraction intensities at 1.17 and 1.33 MeV using 40-mm and 80-mm thick mosaic crystals have been enhanced by a factor of 8.6 compared with that of the perfect Si crystal. The integrated reflectivity is well described in statistical dynamical theory.},
 pages = {112402-1--112402-4},
 title = {Enhanced diffraction of MeV γ rays by mosaic crystals},
 volume = {55},
 year = {2016}
}