{"created":"2023-05-15T14:36:32.178360+00:00","id":47056,"links":{},"metadata":{"_buckets":{"deposit":"2391cb1f-510a-4fbe-9920-e196a46479d7"},"_deposit":{"created_by":1,"id":"47056","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"47056"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00047056","sets":["1"]},"author_link":["469874","469875","469870","469869","469873","469871","469872"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2014-09","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"30","bibliographicPageStart":"24","bibliographicVolumeNumber":"335","bibliographic_titles":[{"bibliographic_title":"Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"This paper is focused on the improvement of the heavy charge particle charge resolution of Fluorescent Nuclear Track Detector (FNTD) technology. Fluorescent intensity of individual heavy charge particle tracks is used to construct the spectrum. Sources of spectroscopic line broadening were investigated and several fluorescent intensity correction procedures were introduced to improve the charge resolution down to dZ = 0.25 c.u. and enable FNTD technology to distinguish between all projectile fragments of 290 MeV carbon ions. The benefits of using FNTD technology for fragmentation study include large dynamic range and wide angular acceptance. While we describe these developments in the context of fragmentation studies, the same techniques are readily extended to FNTD LET spectroscopy in general.","subitem_description_type":"Abstract"}]},"item_8_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"Elsevier Scientific Publishers"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Bartz, J.A."}],"nameIdentifiers":[{"nameIdentifier":"469869","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平, 聡"}],"nameIdentifiers":[{"nameIdentifier":"469870","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"蔵野, 美恵子"}],"nameIdentifiers":[{"nameIdentifier":"469871","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Yasuda, N."}],"nameIdentifiers":[{"nameIdentifier":"469872","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Akselrod, M.S."}],"nameIdentifiers":[{"nameIdentifier":"469873","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"小平 聡","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"469874","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"蔵野 美恵子","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"469875","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"High resolution charge spectroscopy of heavy ions with FNTD technology","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"High resolution charge spectroscopy of heavy ions with FNTD technology"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-25"},"publish_date":"2015-03-25","publish_status":"0","recid":"47056","relation_version_is_last":true,"title":["High resolution charge spectroscopy of heavy ions with FNTD technology"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-15T23:44:26.070013+00:00"}