@article{oai:repo.qst.go.jp:00046776,
 author = {Yamauchi, Tomoya and Matsukawa, Kenya and Mori, Yutaka and Kanasaki, Masato and Hattori, Atsuto and Matai, Yuri and Kusumoto, Tamon and Tao, Akira and Oda, Keiji and Kodaira, Satoshi and Konishi, Teruaki and Kitamura, Hisashi and Yasuda, Nakahiro and Barillon, Remi and Kenya, Matsukawa and Atsuto, Hattori and Yuri, Matai and Tamon, Kusumoto and Satoshi, Kodaira and Teruaki, Konishi and Hisashi, Kitamura},
 issue = {4},
 journal = {Applied Physics Express},
 month = {Apr},
 note = {The track registration property in polyimide Kapton has been examined for heavy ions, including 2.3GeV Fe and 24 GeV Xe ions. Conventional track formation criteria fail to predict the thresholds of etch pit formation, while a chemical criterion stating that etchable tracks are formed when two adjacent diphenyl ethers are broken in the vicinity of the ion’s trajectory should be more appropriate. Discriminative detections of ultra-heavy components in cosmic rays, such as Bi, Th, and U ions, are possible by measuring the recorded track length.},
 pages = {046401-1--046401-4},
 title = {Applicability of Polyimide Films as Etched-Track Detectors for Ultra-Heavy Cosmic Ray Components},
 volume = {6},
 year = {2013}
}