@article{oai:repo.qst.go.jp:00045087,
 author = {Saitoh, Katsumi and Hamano, Tsuyoshi and Iso, Hiroyuki and Ishikawa, Takahiro and Imaseki, Hitoshi and 齊藤 勝美 and 濱野 毅 and 磯 浩之 and 石川 剛弘 and 今関 等},
 issue = {3/4},
 journal = {International Journal of PIXE},
 month = {},
 note = {In order to confirm the availability of an in-air Helium ion induced X-ray emission method for multi-elemental analysis of polytetrafluoroetylene (PEFE) filter sample containing atmospheric particles, NIST urban particulate matter (SRM 1648) collected on PTFE filter using a special small chamber was analyzed by an in-air PIXE method with Helium ions and proton beam, In addition, we analyzed 10 elements, mixing a standard solution with different concentrations to 
confirm, detection sensitivity of characteristic X-ray peaks, As a result, it is suggested that 1) elements that are lighter than Zn and Pb can be satisfactorily measured using the in-air Helium ion induced X-ray emission method if the amount contained in the filter sample is at least 0.1 mg/L, i.e., 15ng/cm2 , 2) the in-air Helium ion induced X-ray emission method is useful as a method for quantitatively analyzing the light elements such as Mg, Al, Si, S and Cl that are important for identifying the behavior and characteristics of atmospheric particles from the PTFE filter sample containing atmospheric particles, and 3) in the case of the PTFE filter sample containing atmospheric particles, it is possible to measure elements from Mg to Pb by means of analysis using Helium ions an protons.},
 pages = {143--149},
 title = {ELEMENTAL ANALYSIS OF ATMOSPHERIC PARTICLES COLLECTED ON POLYTERAFLUOROETYLENE (PTFE) FILTER USING IN-AIR HELIUM ION INDUCED X-RAY EMISSION METHOD},
 volume = {17},
 year = {2007}
}