@article{oai:repo.qst.go.jp:00044961,
 author = {Shibuya, Kengo and Koshimizu, Masanori and Asai, Keisuke and Muroya, Yuusa and Katsumura, Yousuke and Inadama, Naoko and Yoshida, Eiji and Nishikido, Fumihiko and Yamaya, Taiga and Murayama, Hideo and 澁谷 憲悟 and 室屋 裕佐 and 勝村 庸介 and 稲玉 直子 and 吉田 英治 and 錦戸 文彦 and 山谷 泰賀 and 村山 秀雄},
 issue = {8},
 journal = {Review of Scientific Instruments},
 month = {Aug},
 note = {We introduce experimental systems which use accelerators to evaluate scintillation properties such as scintillation intensity, wavelength, and lifetime. A single crystal of good optical quality is often unavailable during early stages in the research and development (R&D) of new scintillator materials. Because of their beams' high-excitation power and/or low-penetration depth, accelerators facilitate estimation of the properties of early samples which may only be available as powders, thin films and very small crystals. We constructed a scintillation spectrum measurement system that uses a Van de Graaff accelerator and an optical multichannel analyzer to estimate the relative scintillation intensity. In addition, we constructed a scintillation time profile measurement system that uses an electron linear accelerator and a femtosecond streak camera or a microchannel plate photomultiplier tube followed by a digital oscilloscope to determine the scintillation lifetimes. The time resolution is approximately 10 ps. The scintillation spectra or time profiles can be obtained in a significantly shorter acquisition time in comparison with that required by conventional measuring systems. The advantages of the systems described in this study can significantly promote the R&D of novel scintillator materials.},
 pages = {083303-1--083303-7},
 title = {Application of Accelerators for the Research and Development of Scintillators},
 volume = {78},
 year = {2007}
}