@article{oai:repo.qst.go.jp:00044789,
 author = {Saitoh, Katsumi and Sera, Kouichirou and Imaseki, Hitoshi and Shinohara, M and Fujiwara, Masahiko and 齊藤 勝美 and 今関 等},
 issue = {1/2},
 journal = {International Journal of PIXE},
 month = {},
 note = {In order to obtain high time-resolution, i.e., chemical data of atmospheric particulate matter (PM) at one-hour intervals, we carried out direct analysis of suspended particulate matter (SPM) on hourly spot samples on a new type of PTFE ultra-membrane filter-tape mounted in an automated beta-ray absorption mass monitor by conventional PIXE.  Analysis of hourly SPM spot samples revealed 20 elements (Na, Mg, Al, Si, S, Cl, K, Ca, Mn, Fe, Co, Ni, Cu, Zn, Ga, As, Se, Br, Sr, and Pb) in total.  Therefore, we are convinced that the chemical information that is obtained from high time-resolution PM spot samples on a PTFE membrane filter-tape mounted in an automated beta-ray  absorption mass monitor will lead to new developments in PM research.  Furthermore, elemental data obtained by the high time-resolution along with data for ionic species compositions, and SO2, NOx and other gaseous air pollutants at the same level, will make possible the analysis of detailed air pollution phenomenon.},
 pages = {95--101},
 title = {PIXE analysis of spot samples on new type of PTFE ultra-membrane filter-tape mounted in an automated beta-ray absorption mass monitor},
 volume = {16},
 year = {2006}
}