{"created":"2023-05-15T14:34:00.752937+00:00","id":44095,"links":{},"metadata":{"_buckets":{"deposit":"13fdd52d-9e40-4cc2-b742-6c599eec6f82"},"_deposit":{"created_by":1,"id":"44095","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"44095"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00044095","sets":["1"]},"author_link":["438359","438362","438363","438358","438360","438365","438364","438361"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2000","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicPageEnd":"96","bibliographicPageStart":"88","bibliographicVolumeNumber":"17","bibliographic_titles":[{"bibliographic_title":"医用画像情報学会雑誌"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We have attempted to calculate a primary X-ray spectrum of CT (Computed Tomography) system. Dose rates of primary X-ray spectrum are very high, so we reduced dose rate by using carbon scatterer and enabled to measure 90°-scattered spectrum with a CdZnTe detector. The primary X-ray spectrum can be calculated from measured data of 90°-scattered spectrum by counting backwards. In counting backwards, we used not only Klein-Nishina co-efficients but also response functions obtained by Monte Carlo methods, because Raylei scattering and multiple scattering maybe occur in carbon scatterer.\n In our results, the primary X-ray spectrum calculated from response functions obtained by Monte Carlo methods are roughly equivalent to that calculated from Klein-Nishina coefficients.","subitem_description_type":"Abstract"}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0910-1543","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"松本, 政雄"}],"nameIdentifiers":[{"nameIdentifier":"438358","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"岡本, 英明"}],"nameIdentifiers":[{"nameIdentifier":"438359","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"黒田, 知純"}],"nameIdentifiers":[{"nameIdentifier":"438360","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"鈴木, 隆一郎"}],"nameIdentifiers":[{"nameIdentifier":"438361","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"松本, 徹"}],"nameIdentifiers":[{"nameIdentifier":"438362","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"その他"}],"nameIdentifiers":[{"nameIdentifier":"438363","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"松本 政雄","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"438364","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"松本 徹","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"438365","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"CT装置の一次X線スペクトルの解析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"CT装置の一次X線スペクトルの解析"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2006-05-29"},"publish_date":"2006-05-29","publish_status":"0","recid":"44095","relation_version_is_last":true,"title":["CT装置の一次X線スペクトルの解析"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-16T00:19:28.634731+00:00"}