{"created":"2023-05-15T14:33:34.121333+00:00","id":43541,"links":{},"metadata":{"_buckets":{"deposit":"7b26b1a5-bcfa-45e2-83d5-a1035414ce3e"},"_deposit":{"created_by":1,"id":"43541","owners":[1],"pid":{"revision_id":0,"type":"depid","value":"43541"},"status":"published"},"_oai":{"id":"oai:repo.qst.go.jp:00043541","sets":["1"]},"author_link":["432973","432974","432980","432978","432979","432975","432982","432981","432976","432977"],"item_8_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2003-05","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"495","bibliographicPageStart":"485","bibliographicVolumeNumber":"503","bibliographic_titles":[{"bibliographic_title":"Nuclear Instruments & Methods in Physics Research Section A"}]}]},"item_8_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"An irradiation method for spot scanning has been developed in order to provide accurate irradiation even for an irregular target shape. In spot scanning irradiation, the beam is turned off while the beam position is shifted to the next spot for precise dose management. Recently, the fast beam cut-off method, which can achieve a cut-off time of around 50 micro sec, was proposed and verified at the HIMAC synchrotron. In order to utilize such a speciality of the technique for spot scanning, the characteristics of fast beam switching were investigated while turning on/off both the transverse and longitudinal RF fields many times during a single flattop. As a result, it was verified that this technique provides more than 50 spots during a single flattop in the synchrotron operation pattern with a cut-off time of 50 ms. With an increase in a switching number, the momentum spread and the size of the extracted beam increase within the allowable range for practical usage.","subitem_description_type":"Abstract"}]},"item_8_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0168-9002","subitem_source_identifier_type":"ISSN"}]},"item_access_right":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"metadata only access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_14cb"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Furukawa, Takuji"}],"nameIdentifiers":[{"nameIdentifier":"432973","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Noda, Kouji"}],"nameIdentifiers":[{"nameIdentifier":"432974","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Urakabe, Eriko"}],"nameIdentifiers":[{"nameIdentifier":"432975","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Muramatsu, Masayuki"}],"nameIdentifiers":[{"nameIdentifier":"432976","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Kanazawa, Mitsutaka"}],"nameIdentifiers":[{"nameIdentifier":"432977","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"古川 卓司","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"432978","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"野田 耕司","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"432979","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"新谷 恵理子","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"432980","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"村松 正幸","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"432981","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"金澤 光隆","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"432982","nameIdentifierScheme":"WEKO"}]}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Characteristics of fast beam switching for spot scanning","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Characteristics of fast beam switching for spot scanning"}]},"item_type_id":"8","owner":"1","path":["1"],"pubdate":{"attribute_name":"公開日","attribute_value":"2004-11-16"},"publish_date":"2004-11-16","publish_status":"0","recid":"43541","relation_version_is_last":true,"title":["Characteristics of fast beam switching for spot scanning"],"weko_creator_id":"1","weko_shared_id":-1},"updated":"2023-05-16T00:26:01.492568+00:00"}