@article{oai:repo.qst.go.jp:00043409,
 author = {Saitoh, Katsumi and Watanabe, Yoshito and Imaseki, Hitoshi and Yukawa, Masae and 齊藤 勝美 and 渡辺 嘉人 and 今関 等 and 湯川 雅枝},
 issue = {3&4},
 journal = {International Journal of PIXE},
 month = {},
 note = {Micro-beam scanning PIXE (micro-PIXE) and scanning transmisssion ion microscopy (STIM)were applied to measurement of one-year old seeding root from a Siebold's beech(Fagus crenata Blume) tree. The beech seedling root samples were collected at the centerpiece of the Shirakami-Sanchi World Heritage Area during October 2001. Target samples for micro-PIXE and STIM analyses were transverse sections from tip, midpoint and root of the beech seedling root. We focused shedding light on tree root. STIM images were similar to those generated using stereomicroscope and/or transmission microscopy. Real images in the form of elemental maps were obtained for nine elements: Na, Mg, Al, Si, P, S, Cl, K, and Ca. Of these typical elemental maps were Si and Ca, which were both, concentrated in the epidermis. Si was prominent in the tip, while Ca was prominent in the root.},
 pages = {115--119},
 title = {Application of Micro-PIXE in Atmospheric Environmental Science Research:Elemental Maps in Root of Siebold's Beech Seeding},
 volume = {13},
 year = {2003}
}