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  1. 原著論文

Muonium as a probe of point defects in type-Ib diamond

https://repo.qst.go.jp/records/2002880
https://repo.qst.go.jp/records/2002880
51e56faa-81ec-4c8c-8c93-14bd09278f19
アイテムタイプ 学術雑誌論文 / Journal Article(1)
公開日 2026-02-27
タイトル
タイトル Muonium as a probe of point defects in type-Ib diamond
言語 en
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
著者 K. Yokoyama

× K. Yokoyama

K. Yokoyama

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J.S. Lord

× J.S. Lord

J.S. Lord

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Abe Hiroshi

× Abe Hiroshi

Abe Hiroshi

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Ohshima Takeshi

× Ohshima Takeshi

Ohshima Takeshi

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抄録
内容記述タイプ Abstract
内容記述 Muonium (Mu), a bound state of a positively charged muon and an electron, can diffuse through crystal lattices and interact with defect centers in insulators and semiconductors. We demonstrate that this Mu's diffusive property can be used to probe defects in a diamond crystal lattice; specifically, substitutional nitrogen atoms (Ns0) and nitrogen-vacancy (NV) centers in type-Ib diamond. Upon interaction with these defects, Mu can exchange its electron's spin or change its charge state, which result in muon spin relaxation. However, muons in diamond (and semiconductors in general) can be in a few distinctive muonium states, with each state contributing to the muon signal. In addition, these states can undergo site and charge exchange interaction, forming a dynamic network. Hence, to study the Mu interaction with point defects, the muon data have to be deconvoluted to isolate signals from the diffusing species. To achieve this goal, we have modeled the Mu state exchange dynamics and numerically simulated the time evolution of muon spin polarization by the density matrix method. With a global curve fit to a set of longitudinal field scan data, one can extract the Mu transition rates that involve interaction with the defect centers. The diffusing tetrahedral interstitial Mu was found to interact with the paramagnetic Ns0 center via electron spin exchange. In contrast, they are converted to form a diamagnetic center upon interaction with the negatively charged NV center.
書誌情報 PHYSICAL REVIEW Research

発行日 2026-02
出版者
出版者 APS Journals
ISSN
収録物識別子タイプ ISSN
収録物識別子 2643-1564
DOI
識別子タイプ DOI
関連識別子 10.1103/jn9c-fprb
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