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  1. 原著論文

Optical Design and Efficiency Measurement of an Extreme Ultraviolet High-Resolution Spectrometer for Unresolved Transition Array Research

https://repo.qst.go.jp/records/2002663
https://repo.qst.go.jp/records/2002663
120d6fe2-4d1a-4fff-b6ee-52f27b74edcb
アイテムタイプ 学術雑誌論文 / Journal Article(1)
公開日 2026-02-02
タイトル
タイトル Optical Design and Efficiency Measurement of an Extreme Ultraviolet High-Resolution Spectrometer for Unresolved Transition Array Research
言語 en
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_6501
資源タイプ journal article
著者 Kawate Tomoko

× Kawate Tomoko

Kawate Tomoko

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Tomoko Kawate

× Tomoko Kawate

Tomoko Kawate

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H. A. Sakaue

× H. A. Sakaue

H. A. Sakaue

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C. Suzuki

× C. Suzuki

C. Suzuki

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N. Nakamura

× N. Nakamura

N. Nakamura

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K. Tanaka

× K. Tanaka

K. Tanaka

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E. Nakamura

× E. Nakamura

E. Nakamura

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K. Fujii

× K. Fujii

K. Fujii

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D. Kato

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D. Kato

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Sasaki Akira

× Sasaki Akira

Sasaki Akira

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I. Murakami

× I. Murakami

I. Murakami

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抄録
内容記述タイプ Abstract
内容記述 Understanding the structures of the unresolved transition array (UTA) observed in extreme ultraviolet (EUV) spectra from many-electron atoms is crucial for various applications, including fusion science and nanolithography. To measure the fine structure of the UTA from tungsten and tin at around 5 and 13.5 nm at the Tokyo electron beam ion trap, we developed a high-resolution EUV spectrometer. The designed spectrometer achieves a resolving power of λ/dλ > 5000 at 5 and 13.5 nm. The fabricated large-area grating was experimentally examined at beamline BL5B of the UVSOR synchrotron facility to evaluate the diffraction efficiencies and their variation across the ruled area. The measured diffraction efficiencies are 0.65% ± 0.07% at 5 nm (second order) and 7.9% ± 0.2% at 13.5 nm (first order). The variation in the diffraction efficiency across the ruled area is 2.2%, 13.6%, and 10.0% in zeroth, first, and second order diffractions, respectively. The discrepancies in diffraction efficiencies between the experiments and the calculations were 5.2%, 29%, and 35% for the zeroth, first, and second diffraction orders, respectively.
書誌情報 Review of Scientific Instruments

巻 96, p. 043512, 発行日 2026-04
出版者
出版者 AIP Publishing
DOI
識別子タイプ DOI
関連識別子 10.1063/5.0250066
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