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Evaporative Concentration of Solution onto a Hydrophilic Spot Preserved on a Fluorine-Coated Glass Slide for High-Sensitivity TXRF Analysis

https://repo.qst.go.jp/records/2002341
https://repo.qst.go.jp/records/2002341
0ae46649-82d4-453f-8db0-f0c0dbd88c3d
アイテムタイプ 会議発表用資料 / Presentation(1)
公開日 2025-10-07
タイトル
タイトル Evaporative Concentration of Solution onto a Hydrophilic Spot Preserved on a Fluorine-Coated Glass Slide for High-Sensitivity TXRF Analysis
言語 en
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言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_c94f
資源タイプ conference presentation
著者 Yanagisawa Ukyou

× Yanagisawa Ukyou

Yanagisawa Ukyou

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Kimura Mototetsu

× Kimura Mototetsu

Kimura Mototetsu

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Wang Hui

× Wang Hui

Wang Hui

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Matsuyama Tsugufumi

× Matsuyama Tsugufumi

Matsuyama Tsugufumi

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Sakai Yasuhiro

× Sakai Yasuhiro

Sakai Yasuhiro

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Yoshii Hiroshi

× Yoshii Hiroshi

Yoshii Hiroshi

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抄録
内容記述 Total reflection X-ray fluorescence (TXRF) analysis is typically utilized to analyze trace ele-ments. Our research group has employed this technique to analyze uranium in solution [1]. Dur-ing the TXRF analysis of a liquid sample, several microliters of the solution were dropped onto a fluorine-coated glass slide and dried. However, the sensitivity of the measurement can be im-proved by increasing the volume of the sample dropped onto the measurable area. In principle, a solution of the same concentration can be measured with tenfold sensitivity by dropping 10 times its volume onto the same spot size. In this study, we propose a more sensitive TXRF analy-sis method by applying a fluorine coating to the outside part of a hydrophilic slide glass, except for the central spot, which allows 1 mL of the solution to be dropped.The hydrophilic surface-treated glass slide was covered on one side with polyimide tape, and the outer tape was cut off, leaving a 6 mm diameter of making area in the center. Then, a fluororesin solution (Fine Chemical Japan Co., Ltd.) was sprayed onto the surface, and after drying, the masking tape was removed. The sample was prepared by diluting a multielement standardized solution of XSTC-4470 (Spex CertiPrep Inc.) containing 10 ng/μL of uranium, and 1 mL of this solution was dropped onto the hydrophilic spot of the glass slide. The dropped solution was evaporated under redused pressure to shrink onto a 6 mm-hydrophilic spot, followed by adding 10 μL of 1 ng/μL Ga solution as an internal standard, and then dried completely. All measure-ments were performed using a TXRF spectrometer NANOHUNTER-II (Rigaku Co., Ltd.), at a tube voltage and current of 50 kV and 12 mA, respectively.As illustrated in Figure 1, the solution on the fluorine-coated area shrinks to the hydrophilic spot during the drying process. This facilitates TXRF analysis with higher sensitivity than conven-tional methods.This study was performed under the auspices of the Secretariat of the Nuclear Regulation Authority, Japan.Reference[1] T. Matsuyama, et al., Frontier in Chemistry 7 (2019) 152.
会議概要(会議名, 開催地, 会期, 主催者等)
内容記述 The 20th International Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF2025)
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日付 2025-09-12
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