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内容記述 |
TXRF analysis of samples containing U and Pu was previously performed by our group [1]. However, when a sample contains Sr, the analysis of Pu will be impeded because of overlapping of the Pu Lα peak (14.28 keV) with the Sr Kα peak (14.17 keV). The major isotopes of Pu spontaneously emit characteristic X-rays of their daughter nuclide, U, upon internal conversion after alpha decay [2]. Using a TXRF analyzer, the spontaneously emitted characteristic X-rays can be detected by setting the X-ray tube output to zero so that no X-rays are irradiated onto the sample (Figure 1). Portable TXRF analyzer 200-FAS (Ourstex) is a modified version of the commercially available 200-TX [1,3] and can measure the spontaneously emitted characteristic X-rays by setting the incident X-ray power to zero. This method enables analyzing Pu even in the presence of nonradioactive Sr.In this study, we developed a method to detect U by TXRF analysis and Pu by measuring the spontaneously emitted characteristic X-rays by dropping a solution containing U, Pu, and Sr onto a glass plate. Although spontaneously emitted characteristic X-rays are detected during TXRF analysis, the intensity of their signal is considerably lower than that of the background signal, and they do not interfere with the analysis. This study was performed under the auspices of the Secretariat of the Nuclear Regulation Authority, Japan.References[1] Yoshii, et al., Adv. X-Ray. Chem. Anal., Japan. 54 (2023) 129.[2] Yoshii, et al., Talanta 286 (2025) 127531.[3] Izumoto, et al., Spectrochim. Acta Part B At. Spectrosc. 173 (2020) 105977. |
