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内容記述 |
Angle-resolved photoemission spectroscopy (ARPES) is renowned for its powerful capability to probe the electronic structures of quantum materials, including high-temperature superconductors, topological insulators, and low-dimensional materials [1]. Recently, we have developed beamline 06U [2] at NanoTerasu, a 3-GeV high-brilliance synchrotron radiation facility located in Tohoku, Japan, dedicated to micro- and nano-focused ARPES (micro-ARPES and nano-ARPES). The micro-ARPES system has been open to general users since March 2025 [3]. The beamline provides brilliant soft X-rays with various polarizations (linear horizontal and vertical, as well as left and right circular) within the energy range of 50–1,000 eV, generated by a 4-meter-long APPLE-II-type undulator. Two distinct operational modes—a high-energy-resolution mode tailored for high-resolution micro-ARPES and a low-divergence mode optimized for high-flux nano-ARPES—can be selected by adjusting a collimated plane grating monochromator (cPGM).In this presentation, we introduce detailed specifications and the current status of the versatile high-resolution micro-ARPES branch at BL06U, specifically focusing on the spin-resolved soft X-ray ARPES (SX-ARPES) system capable of micro-scale spatial resolution. To realize high-resolution spin-resolved SX-ARPES, a very low energy electron diffraction (VLEED)-type spin detector will be installed, providing approximately 100 times higher detection efficiency compared to conventional Mott-type spin detectors [4]. Additionally, the customized sample manipulator enables in situ application of various external fields while maintaining full rotational degrees of freedom. We also present representative ARPES data from strongly correlated electron systems, such as cuprates and ruthenates, to demonstrate the outstanding performance and quality of both the beamline and the micro-ARPES system.Keywords: ARPES, micro-ARPES, spin-resolved ARPES, strongly correlated electron systems1H. Iwasawa et al., Electron. Struct. 2, 043001 (2020).2https://www.qst.go.jp/uploaded/attachment/18596.pdf3K. Horiba et al., J. Phys.: Conf. Ser. 2380, 012034 (2022).4T. Okuda et al., Rev. Sci. Instrum. 79, 123117 (2008). |
