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内容記述 |
To gain a deeper understanding of radiation-induced amorphization, high-resolution ABF/ADF and STEM-EDS techniques were utilized for the irradiation of single crystal SrTiO3 with 160 keV O+ at room temperature. The results show that oxygen column damage increased with irradiation dose, however, the local specific damage level was determined from the depth profiles of irradiation dose, dose rate, and amount of implanted oxygen at different fluences. HAADF observations indicated a decrease in Sr and Ti column intensities with increasing irradiation dose, initially monotonic, then slowing above 5 dpa and accelerating again above 30 dpa. This behavior suggests that the accumulation of topological and chemical disordering depends on the damage level. STEM-EDS analysis revealed periodic concentration changes of Sr and Ti based on the atomic arrangement of the crystal in unirradiated SrTiO3. By comparing irradiated and unirradiated samples, the concentration changes associated with oxygen implantation and the formation of chemical and topological disordering were confirmed. These results highlight the potential of STEM-EDS to characterize the evolution of irradiated microstructures in SrTiO3, even with a relatively low spatial resolution probe. Consequently, this study offers valuable insights into the mechanisms of radiation-induced instability of SrTiO3, contributing to the visualization of irradiation microstructure in various materials as well. |
