| アイテムタイプ |
学術雑誌論文 / Journal Article(1) |
| 公開日 |
2024-08-30 |
| タイトル |
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タイトル |
Feasibility Study of Thin Film Surface Analysis Using Synchrotron Low-Angle Incidence Conversion Electron Mossbauer Spectroscopy |
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言語 |
en |
| 言語 |
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言語 |
eng |
| 資源タイプ |
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資源タイプ識別子 |
http://purl.org/coar/resource_type/c_6501 |
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資源タイプ |
journal article |
| 著者 |
Takaya Mitsui
Kosuke Fujiwara
Ko Mibu
Ryo Masuda
Yasuhiro Kobayashi
Makoto Seto
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| 抄録 |
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内容記述タイプ |
Abstract |
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内容記述 |
Specular reflection of X-rays and nuclear resonant γ-rays from a 57Fe[90%] enriched thin film and its effect on the conversion electron Mossbauer spectroscopy (CEMS) were studied by energy domain 57Fe grazing incidence synchrotron Mossbauer spectroscopy. At incidence angles θin near the critical angle θc~ 0.2° for 14.4 keV X-rays, strong nuclear resonant specular reflection occurred and CEMS showed an abnormal spectral profile. At θin> θc, the nuclear resonant specular reflection gradually decreased with increasing θin, and the electronically forbidden but nuclear allowed pure nuclear specular reflection were persistently observed from θin=0.5° to θin= 1.5°. Finally, pure nuclear specular reflection vanished at θin= 3.0° and CEMS showed a normal spectral profile, allowing a highly efficient measurement of a few nm at the thin film surface. |
| 書誌情報 |
Journal of the Physical Society of Japan
巻 93,
号 3,
p. 034705-1-034705-7,
発行日 2024-02
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| 出版者 |
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出版者 |
The Physical Society of Japan |
| ISSN |
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収録物識別子タイプ |
ISSN |
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収録物識別子 |
0031-9015 |
| DOI |
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識別子タイプ |
DOI |
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関連識別子 |
10.7566/JPSJ.93.034705 |
