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Coherent Electrical Readout of Spin-Active Defects in 4H-SiC for Quantum Sensors using Photo-Ionization at Ambient Conditions
https://repo.qst.go.jp/records/78273
https://repo.qst.go.jp/records/78273aa4fe9e0-3f22-42a6-9240-db39daeec75e
Item type | 会議発表用資料 / Presentation(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2019-12-28 | |||||
タイトル | ||||||
タイトル | Coherent Electrical Readout of Spin-Active Defects in 4H-SiC for Quantum Sensors using Photo-Ionization at Ambient Conditions | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_c94f | |||||
資源タイプ | conference object | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Niethammer, Matthias
× Niethammer, Matthias× Widmann, Matthias× Rendler, Torsten× Morioka, Naoya× Chen Chen, Yu× Rainer, Stöhr× al Hassan, Jawad× Onoda, Shinobu× Ohshima, Takeshi× Sang-Yun, Lee× Mukherjee, Amlan× Isoya, Junichi× Tien Son, Nguyen× Jörg, Wrachtrup× Onoda, Shinobu× Ohshima, Takeshi |
|||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Coherent Electrical Readout of Spin-Active Defects in 4H-SiC for Quantum Sensors using Photo-Ionization at Ambient Conditions is presented. | |||||
会議概要(会議名, 開催地, 会期, 主催者等) | ||||||
内容記述タイプ | Other | |||||
内容記述 | International Conference on Silicon Carbide and Related Materials 2019 | |||||
発表年月日 | ||||||
日付 | 2019-10-01 | |||||
日付タイプ | Issued |