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Evaluation of Voltage between Conductors for Resonance Phenomenon and Transient Response in JT-60SA Central Solenoid

https://repo.qst.go.jp/records/72437
https://repo.qst.go.jp/records/72437
f44ace78-dca8-41f6-a0a0-2126eb86b146
Item type 会議発表用資料 / Presentation(1)
公開日 2017-09-13
タイトル
タイトル Evaluation of Voltage between Conductors for Resonance Phenomenon and Transient Response in JT-60SA Central Solenoid
言語
言語 eng
資源タイプ
資源タイプ識別子 http://purl.org/coar/resource_type/c_c94f
資源タイプ conference object
アクセス権
アクセス権 metadata only access
アクセス権URI http://purl.org/coar/access_right/c_14cb
著者 Nakamura, Kazuya

× Nakamura, Kazuya

WEKO 713452

Nakamura, Kazuya

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Fujiyama, Sho

× Fujiyama, Sho

WEKO 713453

Fujiyama, Sho

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Nasu, Keisuke

× Nasu, Keisuke

WEKO 713454

Nasu, Keisuke

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Meguro, Hirotaka

× Meguro, Hirotaka

WEKO 713455

Meguro, Hirotaka

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Takao, Tomoaki

× Takao, Tomoaki

WEKO 713456

Takao, Tomoaki

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Murakami, Haruyuki

× Murakami, Haruyuki

WEKO 713457

Murakami, Haruyuki

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Natsume, Kyohei

× Natsume, Kyohei

WEKO 713458

Natsume, Kyohei

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Kizu, Kaname

× Kizu, Kaname

WEKO 713459

Kizu, Kaname

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村上 陽之

× 村上 陽之

WEKO 713460

en 村上 陽之

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夏目 恭平

× 夏目 恭平

WEKO 713461

en 夏目 恭平

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木津 要

× 木津 要

WEKO 713462

en 木津 要

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抄録
内容記述タイプ Abstract
内容記述 An inhomogeneous voltage distribution in the coil is induced by the resonance phenomenon and transient response caused by the power supply. Therefore, damage to the insulation between conductors in the coils is possible. We created the circuit simulation models of the CS module (the 52-layer pancake coil) with the room-temperature busbar and superconducting current feeder between the power supply and CS module. Then, we evaluated the behavior of the voltage between the conductors for the resonance phenomenon and transient response caused by the supply voltage in the CS module. Based on the results, we can conclude that the influences of resonance phenomenon and transient response on the voltage between the conductors in the CS module is negligibly small under the expected operating conditions. These results therefore represent important information for the safe operation of the JT-60SA.
会議概要(会議名, 開催地, 会期, 主催者等)
内容記述タイプ Other
内容記述 25th International Conference on Magnet Technology (MT-25)
発表年月日
日付 2017-08-29
日付タイプ Issued
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