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Transient current mapping obtained from silicon photodiodes ueing focused ion microbeams with several hundreds of MeV
https://repo.qst.go.jp/records/45547
https://repo.qst.go.jp/records/4554782da611c-7c36-41e4-84cb-09f131f846bd
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2009-06-19 | |||||
タイトル | ||||||
タイトル | Transient current mapping obtained from silicon photodiodes ueing focused ion microbeams with several hundreds of MeV | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Hirao, Toshio
× Hirao, Toshio× Onoda, Shinobu× Oikawa, Masakazu× Satoh, Takahiro× Kamiya, Tomihiro× Ohshima, Takeshi× 及川 将一 |
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書誌情報 |
Nuclear Instruments & Methods in Physics Research Section B 巻 267, 号 12-13, p. 2216-2218, 発行日 2009-06 |
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ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0168-583X |