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Comparison between Tomography and Langmuir Probe Data in PANTA
https://repo.qst.go.jp/records/80899
https://repo.qst.go.jp/records/8089926ee2631-3d07-43fa-bae1-a320af15d553
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2020-11-05 | |||||
タイトル | ||||||
タイトル | Comparison between Tomography and Langmuir Probe Data in PANTA | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Nagashima, Yoshihiko
× Nagashima, Yoshihiko× Fujisawa, Akihide× Yamasaki, Kotaro× Inagaki, Shigeru× Moon, Chanho× Kin, Fumiyoshi× Kawachi, Yuichi× Arakawa, Hiroyuki× Yamada, Takuma× Kobayashi, Tatsuya× Kasuya, Naohiro× Kosuga, Yusuke× Sasaki, Makoto× Ido, Takeshi× Fumiyoshi, Kin |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Emission intensity ϵ from plasmas is a complicated function of electron temperature Te and electron density ne. To understand the dependence of ϵ on Te and ne, an experimental comparison between tomography data (local ϵ of ArII) and Langmuir probe data (Te and ne) in a linear plasma device PANTA is presented in this paper. In the comparison, the local emission intensity is modeled as ϵmodel∝Tαen2e, and the model is validated by calculating both cross-correlation function and least squares of residuals between the fluctuations of ϵ and ϵmodel. The comparison reveals that the both methods provide α = 2.3–2.7, higher than 2 that of the exponent of ne. This result confirms that dependence of Te on ϵ is larger than that of ne when Te is low, as in PANTA. | |||||
書誌情報 |
Journal of the Physical Society of Japan 巻 89, 号 9, p. 093501, 発行日 2020-11 |
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出版者 | ||||||
出版者 | The Physical Society of Japan | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0031-9015 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.7566/JPSJ.89.093501 | |||||
関連サイト | ||||||
識別子タイプ | URI | |||||
関連識別子 | https://journals.jps.jp/doi/full/10.7566/JPSJ.89.093501 |