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Study of the Lethal Effect Caused by the Various LET Particle Ion Beam in Budding Yeast S. cerevisiae
https://repo.qst.go.jp/records/74763
https://repo.qst.go.jp/records/7476374521a7b-dca2-42c1-85eb-3aeca4181497
Item type | 一般雑誌記事 / Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2019-03-17 | |||||
タイトル | ||||||
タイトル | Study of the Lethal Effect Caused by the Various LET Particle Ion Beam in Budding Yeast S. cerevisiae | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Matuo, Y.
× Matuo, Y.× 坂本, 綾子× 長谷, 純宏× Shimizu, K.× Sakamoto, Ayako× Hase, Yoshihiro |
|||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | To elucidate the mechanism of the mutation, we investigated the effects of high-LET carbon ion beams on lethality and then compared the results with those of carbon ion beams and neon ion beams obtained in our previous study. Cell survival decreased with an increase in the dose in each ion. At the same dose, the higher LET beam caused greater lethality. However, high-LET neon ions were not significantly more lethal than high-LET carbon ions. The lethality of LET on cells seems to reach a limit above a certain level. This tendency may be related to an overkill effect. In future, we will examine a mutagenesis effect by the various LET particle ion beams. | |||||
書誌情報 |
QST Takasaki Annual Report 2017 p. 102, 発行日 2019-03 |