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Study of Microchip Laser Properties for the Remote Inspection using Laser-Induced Breakdown spectroscopy
https://repo.qst.go.jp/records/66922
https://repo.qst.go.jp/records/6692299b2d6db-ffd2-4f2c-a936-c87bfb5f425e
Item type | 会議発表用資料 / Presentation(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2018-09-21 | |||||
タイトル | ||||||
タイトル | Study of Microchip Laser Properties for the Remote Inspection using Laser-Induced Breakdown spectroscopy | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_c94f | |||||
資源タイプ | conference object | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
田村, 浩司
× 田村, 浩司× 大場, 弘則× 佐伯, 盛久× 田口, 富嗣× Hong, Lim Hwan× 平等拓範× 若井田育夫× 田村 浩司× 大場 弘則× 佐伯 盛久× 田口 富嗣 |
|||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | 遠隔その場分析が可能なファイバー伝送レーザー誘起ブレ-クダウン分光(LIBS)において、超小型ジャイアントパルスレーザーを適用した技術を開発している。本講演では過酷事故炉の廃炉措置適用を念頭に、マイクロチップレーザーの動作特性とLIBSスペクトル測定への放射線照射影響に関して紹介する。 | |||||
会議概要(会議名, 開催地, 会期, 主催者等) | ||||||
内容記述タイプ | Other | |||||
内容記述 | Post-ASLIBS2017 International Symposium Fifth Symposium on Applications of Advanced Measurement Technologies SAAMT2018 | |||||
発表年月日 | ||||||
日付 | 2018-09-22 | |||||
日付タイプ | Issued |