WEKO3
アイテム
{"_buckets": {"deposit": "242f5c55-50f2-4f07-bdf3-5f4f794d3aa3"}, "_deposit": {"created_by": 1, "id": "49443", "owners": [1], "pid": {"revision_id": 0, "type": "depid", "value": "49443"}, "status": "published"}, "_oai": {"id": "oai:repo.qst.go.jp:00049443", "sets": ["1"]}, "author_link": ["734711", "734707", "734710", "734712", "734708", "734709"], "item_8_biblio_info_7": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2018-08", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "10", "bibliographicPageEnd": "929", "bibliographicPageStart": "916", "bibliographicVolumeNumber": "48", "bibliographic_titles": [{"bibliographic_title": "Quantum Electronics"}]}]}, "item_8_description_5": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "We briefly review the works concerned with the development and experimental use of the spectral instruments based on aperiodic reflection gratings whose spacing varies monotonically across the aperture according to a prescribed law (VLS gratings). The review considers the employment of VLS-grating instruments intended for the spectroscopy of laboratory and astrophysical plasmas, including the diagnostics of relativistic laser plasmas, for measuring X-ray laser linewidths, for recording the high-order harmonics of laser radiation, the radiation of fast electric discharges and other laboratory X-ray sources, as well as in reflectometry, X-ray fluorescence analysis and microscopy with the use of synchrotron radiation and laser-plasma radiation, and in emission spectroscopy combined with an electron microscope. Also discussed are achievements in the recently undertaken design and development of special-purpose VLS spectrometers intended for the investigation of the electronic structure of different materials and molecules by the spectroscopic technique of resonant inelastic X-ray scattering of synchrotron radiation. We describe flat-field grazing-incidence spectrometers with concave VLS gratings, which are compatible with modern CCD detectors, as well as plane VLS gratings, which are the key elements of scanning high- and ultrahigh-resolution spectrometers/monochromators with a constant deviation angle and stigmatic (imaging) spectrometers, which are also compatible with CCD detectors.", "subitem_description_type": "Abstract"}]}, "item_8_relation_14": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "10.1070/QEL16707", "subitem_relation_type_select": "DOI"}}]}, "item_8_relation_17": {"attribute_name": "関連サイト", "attribute_value_mlt": [{"subitem_relation_type_id": {"subitem_relation_type_id_text": "http://iopscience.iop.org/article/10.1070/QEL16707", "subitem_relation_type_select": "URI"}}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "metadata only access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_14cb"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "A. Vishnyakov, E."}], "nameIdentifiers": [{"nameIdentifier": "734707", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "O. Kolesnikov, A."}], "nameIdentifiers": [{"nameIdentifier": "734708", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "ピロジコフ, アレキサンダー"}], "nameIdentifiers": [{"nameIdentifier": "734709", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "N. Ragozin, E."}], "nameIdentifiers": [{"nameIdentifier": "734710", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "N. Shatokhin, A."}], "nameIdentifiers": [{"nameIdentifier": "734711", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Pirozhkov, Alexander", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "734712", "nameIdentifierScheme": "WEKO"}]}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Aperiodic reflection diffraction gratings for soft X-ray radiation and their application", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Aperiodic reflection diffraction gratings for soft X-ray radiation and their application"}]}, "item_type_id": "8", "owner": "1", "path": ["1"], "permalink_uri": "https://repo.qst.go.jp/records/49443", "pubdate": {"attribute_name": "公開日", "attribute_value": "2018-12-19"}, "publish_date": "2018-12-19", "publish_status": "0", "recid": "49443", "relation": {}, "relation_version_is_last": true, "title": ["Aperiodic reflection diffraction gratings for soft X-ray radiation and their application"], "weko_shared_id": -1}
Aperiodic reflection diffraction gratings for soft X-ray radiation and their application
https://repo.qst.go.jp/records/49443
https://repo.qst.go.jp/records/49443dc487340-94da-4445-8947-bf58614fd31f
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2018-12-19 | |||||
タイトル | ||||||
タイトル | Aperiodic reflection diffraction gratings for soft X-ray radiation and their application | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
A. Vishnyakov, E.
× A. Vishnyakov, E.× O. Kolesnikov, A.× ピロジコフ, アレキサンダー× N. Ragozin, E.× N. Shatokhin, A.× Pirozhkov, Alexander |
|||||
抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | We briefly review the works concerned with the development and experimental use of the spectral instruments based on aperiodic reflection gratings whose spacing varies monotonically across the aperture according to a prescribed law (VLS gratings). The review considers the employment of VLS-grating instruments intended for the spectroscopy of laboratory and astrophysical plasmas, including the diagnostics of relativistic laser plasmas, for measuring X-ray laser linewidths, for recording the high-order harmonics of laser radiation, the radiation of fast electric discharges and other laboratory X-ray sources, as well as in reflectometry, X-ray fluorescence analysis and microscopy with the use of synchrotron radiation and laser-plasma radiation, and in emission spectroscopy combined with an electron microscope. Also discussed are achievements in the recently undertaken design and development of special-purpose VLS spectrometers intended for the investigation of the electronic structure of different materials and molecules by the spectroscopic technique of resonant inelastic X-ray scattering of synchrotron radiation. We describe flat-field grazing-incidence spectrometers with concave VLS gratings, which are compatible with modern CCD detectors, as well as plane VLS gratings, which are the key elements of scanning high- and ultrahigh-resolution spectrometers/monochromators with a constant deviation angle and stigmatic (imaging) spectrometers, which are also compatible with CCD detectors. | |||||
書誌情報 |
Quantum Electronics 巻 48, 号 10, p. 916-929, 発行日 2018-08 |
|||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.1070/QEL16707 | |||||
関連サイト | ||||||
識別子タイプ | URI | |||||
関連識別子 | http://iopscience.iop.org/article/10.1070/QEL16707 |