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Enhanced diffraction of MeV γ rays by mosaic crystals
https://repo.qst.go.jp/records/47731
https://repo.qst.go.jp/records/47731819aa78b-6eb1-4a4e-8908-0712ef5f0a90
Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2017-04-20 | |||||
タイトル | ||||||
タイトル | Enhanced diffraction of MeV γ rays by mosaic crystals | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | journal article | |||||
アクセス権 | ||||||
アクセス権 | metadata only access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_14cb | |||||
著者 |
Matsuba, Shunya
× Matsuba, Shunya× Hayakawa, Takehito× Shizuma, Toshiyuki× Nishimori, Nobuyuki× Nagai, Ryoji× Sawamura, Masaru× T., Angell Christopher× Fujiwara, Mamoru× Hajima, Ryoichi× 早川 岳人× 静間 俊行× 永井 良治× 沢村 勝× エンジェル クリストファー× 羽島 良一 |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Diffractions of γ rays by Si mosaic crystals with thicknesses of 20, 40, and 80 mm and by a 2-mm thick prefect Si crystal have been measured using a high flux 60Co source with an intensity of 2.2 TBq. The measured diffraction intensities at 1.17 and 1.33 MeV using 40-mm and 80-mm thick mosaic crystals have been enhanced by a factor of 8.6 compared with that of the perfect Si crystal. The integrated reflectivity is well described in statistical dynamical theory. | |||||
書誌情報 |
Japanese Journal of Applied Physics 巻 55, 号 11, p. 112402-1-112402-4, 発行日 2016-10 |
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出版者 | ||||||
出版者 | IOP Publishing | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | 10.7567/JJAP.55.112402 | |||||
関連サイト | ||||||
識別子タイプ | URI | |||||
関連識別子 | http://iopscience.iop.org/article/10.7567/JJAP.55.112402 | |||||
関連名称 | http://iopscience.iop.org/article/10.7567/JJAP.55.112402 |